CSD license (including all tools, such as Mercury) for EPF-users. Selected topics from thin film X-ray diffraction (GIWAXS, GISAXS, PDF, XRR), electronic and optical spectroscopy (XPS, AES, SERS, TERS), scanning probe and electron microscopy (STM, AFM, HRTEM, SEM).ĬSD Database for organic (and metal-organic) compounds. State-of-the-art surface/thin film characterization methods of polycrystalline/nano/amorphous materials. ![]() ![]() ![]() Advanced Solid State and Surface Characterization (CH-632).Familiarization with modern X-ray diffractometers. Experimental aspects of materials-oriented powder and single crystal diffraction. Principals and Applications of X-ray Diffraction (CH-632)īasic theoretical aspects of Crystallography and the interaction between X-ray radiation and matter.Students enrolled in the PhD program will be prioritized with respect to PostDocs, if the number of places is limited. ![]() These courses are awarded with 2 ECTS credits each, and are open to all students. The facility gives two courses within the EDCH program of the Doctoral School of EPFL, which cover basic theory of most methods as well as practical parts.
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